Conference Offers Insight Into Exploration of Nano-sized Electronics
Tuesday, April 21, 2009 - 20:35
in Physics & Chemistry
New methods for exploring the behavior of the high-performance electronics materials and devices that will shape the future of the electronics industry will be the focus of the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, to be held the week of May 11-15, 2009, at the University at Albany.