Vibrating nanorods measure thin films for microcircuits
Friday, December 10, 2010 - 06:01
in Physics & Chemistry
(PhysOrg.com) -- A key step in many nanofabrication processes is to create thin films, sometimes only one molecule thick, by a method known as atomic layer deposition. Researchers at Cornell and Tel Aviv University have developed a new tool for nanofabricators to test the physical properties of such films.
