A new method for measuring X-ray optics aberrations

(PhysOrg.com) -- In a new report, scientists from the University of Rochester, Cornell University, and the Brookhaven and Argonne national laboratories carrying out research at national laboratories including the U.S. Department of Energy’s Advanced Photon Source at Argonne describe phase retrieval methods to measure wavefront aberrations produced by imperfect hard x-ray optics. The authors demonstrate an accurate and easy-to-implement technique that allows both optimized positioning of existing optics and provides quantitative feedback that can guide improved fabrication procedures for future optics.

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