Smallest atomic displacements ever observed
Thursday, September 1, 2011 - 13:31
in Physics & Chemistry
An international team of scientists has developed a novel X-ray technique for imaging atomic displacements in materials with unprecedented accuracy. They have applied their technique to determine how a recently discovered class of exotic materials multiferroics can be simultaneously both magnetically and electrically ordered. Multiferroics are also candidate materials for new classes of electronic devices. The discovery, a major breakthrough in understanding multiferroics, is published in Science dated 2 September 2011.