Imec presents breakthrough results in resistive-switching (R)RAM

Friday, June 15, 2012 - 06:30 in Physics & Chemistry

At this week’s VLSI Technology Symposium (Honolulu, Hawaii), Imec presents significant improvements in performance and reliability of RRAM cells by process improvements and clever stack-engineering, and imec introduces a new modeling approach increasing the fundamental understanding of RRAM process technology. These achievements pave the way towards scalability and manufacturability of RRAM technology.

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