Nanoscale edge variations observed with record-breaking resolution in magnetic nanodevices
Thursday, March 28, 2013 - 08:30
in Physics & Chemistry
(Phys.org) —A team of researchers from the Royal Institute of Technology, Stockholm, the University of Maryland, and the NIST Center for Nanoscale Science and Technology have measured large variations in the magnetic properties along the edge of a thin film 500 nm-diameter disk. This work represents a significant development in the measurement of magnetic thin film edge properties, which are especially important for nanodevices, such as magnetic memory cells, where the edge to area ratio is large.