'Nano scalpel' allows structuring of samples with nanometre precision

A new "nano scalpel" enables scientists at DESY to prepare samples or materials with nanometre precision while following the process with a scanning electron microscope. The Focused Ion Beam, or FIB, microscope which has now gone into service also allows a detailed view of the inner structure of materials. The device was purchased by the University of Bayreuth, as part of a joint research project on the DESY campus funded by the Federal Ministry of Research. The FIB will be operated at the DESY NanoLab jointly with the University of Bayreuth.

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