New test to improve commercial viability of printable electronics
Thursday, September 15, 2016 - 07:01
in Physics & Chemistry
Scientists at the National Physical Laboratory (NPL) have developed a new, non-destructive method of detecting the orientation of molecules in organic semiconductor transistors using Raman spectroscopy. This will create a faster and more flexible method of measuring the efficiency of electrical conductivity in a printed circuit, enabling scientists to understand the quality of their devices.