Single-angle ptychography allows 3-D imaging of stressed materials
Wednesday, March 22, 2017 - 07:31
in Physics & Chemistry
Everyone reacts differently under stress—even the relatively orderly atoms in a crystal. If scientists could get a clear picture of how planes of atoms shift and squeeze under stress, they could make use of those properties to provide emerging technologies, like nanoelectronics and next-generation semiconductor components, with extra speed or functionalities. However, creating this picture requires new techniques for imaging atoms in materials and their behavior in different environments.