Multi-parameter microscopy aids design of improved optoelectronic devices
Friday, March 24, 2017 - 07:32
in Physics & Chemistry
The National Physical Laboratory (NPL) has developed a novel measurement method, providing simultaneous topographical, electrical, chemical and optical microscopy (STEOM) at the nanoscale for the first time. The new method can be used to optimise the performance of optoelectronic devices such as organic solar cells, sensors and transistors.