New X-ray technique for electronic structures: Ability to probe deep below material surfaces should be boon for nanoscale devices
Thursday, August 25, 2011 - 12:30
in Physics & Chemistry
Researchers have led the development of a technique called HARPES, for Hard X-ray Angle-Resolved PhotoEmission Spectroscopy, that enables the study of electronic structures deep below material surfaces, including the buried layers and interfaces in nanoscale devices. This could pave the way for smaller logic elements in electronics, novel memory architectures in spintronics, and more efficient energy conversion in photovoltaic cells.