New high-capability solid-state electron microscope detector enables novel studies of materials
Tuesday, June 7, 2016 - 10:21
in Physics & Chemistry
Scientists developed and demonstrated a new type of imaging electron detector. It records an image frame in 1/1000 of a second, and can detect from 1 to 1,000,000 electrons per pixel. This is 1000 times the intensity range and 100 times the speed of conventional electron microscope image sensors.