Engineers Discover Fundamental Flaw in Transistor Noise Theory
Thursday, May 21, 2009 - 10:28
in Physics & Chemistry
Chip manufacturers beware: There's a new flaw in our understanding of transistor noise, a phenomenon affecting the electronic on-off switch within computer circuits. According to NIST engineers who discovered the problem, it will soon impede the creation of more efficient, lower-powered devices like cell phones and pacemakers unless we solve it.