Electron microscopy enters the picometer scale

Jülich scientists have succeeded in precisely measuring atomic spacings down to a few picometres using new methods in ultrahigh-resolution electron microscopy. This makes it possible to find out decisive parameters determining the physical properties of materials directly on an atomic level in a microscope. Knut Urban from Forschungszentrum Jülich, a member of the Helmholtz Association, reports on this in the latest issue (25 July) of the scientific high-impact journal Science.

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