Smaller Than Small: Ultrahigh-resolution Electron Microscopy Enters Picometer Scale

Scientists have succeeded in precisely measuring atomic spacings down to a few picometers using new methods in ultrahigh-resolution electron microscopy. This makes it possible to find out decisive parameters determining the physical properties of materials directly on an atomic level in a microscope. Progress in research in the area of physics is very frequently connected to an increase in the accuracy of measurements, which help researchers to track natural phenomena.

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