IBM Scientists Effectively Eliminate Wear at the Nanoscale

(PhysOrg.com) -- IBM scientists have demonstrated a promising and practical method that effectively eliminates the mechanical wear in the nanometer-sharp tips used in scanning probe-based techniques. This discovery can potentially be used in the development of next generation, more advanced computer chips that have higher performance and smaller feature sizes. Scanning probe-based tools could be one approach to extend the capabilities, quality and precision beyond the projected limits of current production and characterization tools.

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