Diamonds are a probe`s best friend
Thursday, March 1, 2012 - 08:31
in Physics & Chemistry
Surface imperfections in devices such as gears or levers can have disastrous effects on reliability. Recent studies have demonstrated the usefulness of atomic force microscopes (AFMs) instruments that use tiny silicon-based tips to trace out the topography of all kinds of substrates in determining surface roughness non-destructively. Using AFMs effectively in industrial workplaces, however, is not straightforward and requires a different approach to microscope design. As the AFM tip height and scanning mechanisms restrict measuring movements to fewer than ten micrometers vertically and several tens of micrometers laterally, most AFMs can only measure the surfaces of extremely small objects.