Nanoscale imaging of strain using X-ray Bragg projection ptychography
Tuesday, October 9, 2012 - 08:01
in Physics & Chemistry
(Phys.org)—The theoretical and experimental framework of a new coherent diffraction strain imaging approach was developed in the Center for Nanoscale Materials' X-Ray Microscopy Group in collaboration with Argonne's Materials Science Division, together with users from IBM. Nanofocused X-ray Bragg projection ptychography creates a tool to efficiently image strain fields with unperturbed boundary conditions in technologically and scientifically relevant energy systems.