Advances in nonlinear microscopy allow researchers to take detailed images deep below the surface of samples
Thursday, November 22, 2012 - 08:31
in Physics & Chemistry
Optical microscopes, also known as light microscopes, provide detailed images of sample surfaces, but their use in looking below the surface is limited. A workaround is to look for signals given off by a sample of interest when it interacts simultaneously with two particles of light (or photons), using a technique called nonlinear spectroscopy. Now, Keisuke Isobe and colleagues at the RIKEN Advanced Science Institute, Wako, have shown how nonlinear techniques can be used to peer even more deeply into a sample.